![MICROSTRUCTURAL CHARACTERIZATION OF MATERIALS 2/E](http://im1.book.com.tw/image/getImage?i=http://www.books.com.tw/img/001/040/73/0010407337.jpg&w=348&h=348)
MICROSTRUCTURAL CHARACTERIZATION OF MATERIALS 2/E網路熱賣
站長最近閱讀過 感覺很實用 在此推薦給您
博客來專業及教科書及政府出版品-電機資訊類分類優質推薦
![MICROSTRUCTURAL CHARACTERIZATION OF MATERIALS 2/E](http://xn--jzuv5ptqwbje.tw/yahoo/前往購買.gif)
購買[MICROSTRUCTURAL CHARACTERIZATION OF MATERIALS 2/E]絕對物超所值
點圖即可看詳細介紹
內容簡介
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy.
本書特色
An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises.
...繼續閱讀